Eds analysis services with MicroVision Laboratories, Inc. today? Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.
Approach: MicroVision Labs’ staff consulted with the client, and determined that, unfortunately, there could be a number of potential sources of a white material. Even before the bottle with the suspended material arrived, it was determined that there was less than 50 mL of water remaining, and likely less than a gram of material suspended in the water. The client was aware that this material could represent precipitated minerals from the source water, a polymer residue from the bottles, some form of biological tissue that might have formed despite sterilization procedures, or could very well represent some completely unforeseen foreign material. The issue facing the client is how to have the material tested, as most tests that they might request for one or the other of these known potential sources would destroy or alter the sample. Choosing a test was therefore something of a gamble, because if they tested for calcium (mineral precipitate) and it came up negative – that didn’t actually tell them what the powder was, just that it didn’t have any calcium. Based on this conversation, the non-destructive, specialized testing at MicroVision Laboratories was chosen as the best choice.
The data indicated that a significant portion of the dust was from the insulation in the attic. The contractor had replaced a portion of duct work running to the master bedroom. During this replacement, fiberglass insulation was knocked into the ducting. The small glass insulation fibers were spread through the AC ducts and settling out of the air throughout the house. The client was relieved to know what was causing their skin irritation and the significant dust build up. Using the results garnered from the analysis from MicroVision Labs they were able to have the contractor clean out the duct work and act to prevent further spread of the insulation fibers and properly clean up the settled dust in the house that was the cause of the homeowner’s skin irritation.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. Find more details on https://microvisionlabs.com/service/eds-elemental-analysis/.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Read extra details at https://microvisionlabs.com/.